IPFresearch Team
AM of test specimen and contact measurement
Measurement of AM artifact
Measurement of AM specimen part
Additive Manufacturing Lab
Test bench with dual capability: FFF and layers digitizing
Test bench with an integrated CIS sensor
CIS sensor reverse engineering
Conference (MESIC_2021, Gijón-Spain)
Conference (MESIC_2021, Gijón-Spain)
Conference (MESIC_2021, Gijón-Spain)
Visit to the Spanish Centre for Metrology (Madrid-Spain)
Conference (MESIC_2019, Madrid-Spain)
Conoscopic holography sensor installed on a Machining Centre
Conferences (MESIC_2017, Vigo-Spain)
Conference (MESIC2017, Vigo-Spain)
Influence of slope angle on surface digitizing
Depth of field influence on digitiging in a Machining Centre
Influence of material on CH digitizing
Influence of depth of field on CH digitizing
Influence of roughness on CH digitizing
Conoscan 4000 (Optimet)
CMM DEA Swift A001
Inspection software (Pc-Dmis)
Conference (WCE 2014, London-UK)
Conference (WCE 2014, London-UK)
Start date: 01/01/2018. End date: 30/09/2022.
Budget: 127.050,00 €.
Additive manufacturing processes are opening up a world of possibilities towards obtaining parts with complex geometry and adjustable properties. Its impact in sectors such as b... More info »
Start date: 01/01/2013. End date: 31/12/2015.
Budget: 133.380,00 €.
The current productivity requirements to facilitate the rapid delivery of high quality products to market in which the accuracy achieved in the manufacturing plays a prominent r... More info »
Start date: 01/01/2011. End date: 31/12/2011.
Budget: 12.100,00 €.
The current requirement of precision on freeform surface machining, as well as productivity necessities which facilitate the supply of high quality products to the market, have ... More info »
Funded by the Spanish Ministry of Economy and Competitiveness
